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@inproceedings{li-selse13,
author = {Wenchao Li and Susmit Jha and Sanjit A. Seshia},
title = {Generating Control Logic for Optimized Soft Error Resilience},
booktitle = {Proc. 9th Workshop on Silicon Errors in Logic - System Effects (SELSE)},
month = "March",
year = {2013},
abstract = {Aggressive technology scaling has necessitated the
development of techniques to ensure resilience to device faults,
including soft errors, circuit wear-out, variability, and environmental
effects. All error resilience techniques employ some form
of redundancy, resulting in added cost such as area or power
overhead. Existing selective hardening techniques have been
focused on identifying on the most vulnerable components and
then statically harden them. This paper proposes a new technique
that can further reduce this overhead for error resilience mechanisms
that are controllable. The key idea is to generate control
predicates1 that can turn the resilience mechanisms ON and
OFF dynamically, at the right time. These predicates are mined
using an optimization formulation that leverages fault injection
simulation information. Our experimental results demonstrate
that our approach significantly outperforms the static hardening
approach for optimizing soft error resilience.},
}