Localizing Transient Faults Using Dynamic Bayesian Networks

Susmit Jha, Wenchao Li, and Sanjit A. Seshia. Localizing Transient Faults Using Dynamic Bayesian Networks. In IEEE International High Level Design Validation and Test Workshop (HLDVT), November 2009.

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BibTeX

@inproceedings{JLS-hldvt09,
  author    = {Susmit Jha and Wenchao Li and Sanjit A. Seshia},
  title     = {Localizing Transient Faults Using Dynamic Bayesian Networks},
 booktitle = {IEEE International High Level Design Validation and Test Workshop (HLDVT)},
 month = "November",
 year = {2009},
}