Dan Holcomb

EE Graduate Student

EECS - UC Berkeley

 

 

 

Research Interests:

VLSI design

CAD

Particle-strike induced soft errors

Secure embedded hardware

Process variation in ICs

Publications:

D. Holcomb, W. Li, S. A. Seshia, Design as you see FIT: System-Level Soft Error Analysis of Sequential Circuits, Design Automation and Test in Europe, 2009 (to appear) [paper]

 

D. Holcomb, W. Burleson, K. Fu, Power-up SRAM State as an Identifying Fingerprint and Source of True Random Numbers, IEEE Transactions on Computers, 2009 (to appear) [draft]

V. Ambrose, W. Burleson, D. Holcomb, S. Mukherjee, J. Pickholtz, A Fast and Accurate Method for Simulating Soft Errors in Large Combinatorial Logic Circuits, Intel Design and Test Technology Conference, 2007

 

D. Holcomb, W. Burleson, K. Fu. Initial SRAM state as a fingerprint and source of true random numbers for RFID tags. In Proceedings of the Conference on RFID Security, July 2007. [paper]

E.E. Riddle, P.B. Voss, A. Stohl, D. Holcomb, D. Maczka, K. Washburn, R.W. Talbot, Trajectory model validation during ICARTT-2004 using newly developed altitude-controlled meteorological balloons, Journal of Geophysical Research, December 2006. [paper]

Voss, P.B., D.E. Holcomb, R.A. Zaveri, C.M. Berkowitz, Integrated system optimization of Controlled Meteorological (CMET) balloons, Proceedings of AIAA's 5th Annual Aviation Technology, Integration, and Operations (ATIO) Conference and AIAA 16th Lighter-than-air systems technology conference and balloons systems conference, Arlington, Virginia, 2005. [paper]

1 hardware patent, 1 pending

Biography:

I received my BS and MS degrees in Electrical and Computer Engineering from UMass Amherst in 2005 and 2007. My undergraduate thesis was the design and implementation of a payload and control algorithm for the world’s smallest altitude controlled research balloons. I was fortunate to apply this work in two major air quality studies, of New York City and Houston pollution plumes.

 

During my MS at UMass, I researched particle-strike induced soft errors during two internships at Intel, and researched RFID security at UMass. My MS thesis was on low cost device identification and random number generation in integrated circuits.

 

I am currently at UC Berkeley, working towards a PhD. My advisor is Professor Sanjit Seshia.

Contact: