List of Abstracts for Jeffrey Bokor

The EECS Research Summary for 2003

Scanning Microscopy Probe for Nanomechanical Resonators MinCheol Park
Xuchun Liu
Industrial FinFET Fabrication Using Standard Processing Tools Leland Chang
Advanced EUV Imaging Michael D. Shumway
Study of the Effects of Process Variation in Affecting the Performance of Nano MOSFET Devices Shiying Xiong
Sub 30 nm MOSFET Fabrication Peiqi Xuan
Scanning Microscopy Probe for Nanomechanical Resonators Xuchun Liu
Maskless Lithography with Nanodroplets Yan Wang
Threshold Voltage Control at Double-Gate Devices Yang-Kyu Choi
Nanotechnologies for Nanoparticles and Wires Yang-Kyu Choi
Ji Zhu
(9 abstracts total)