Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

   

2010 Research Summary

MOSFET Stress Modeling Using Pattern Functions

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Andrew R. Neureuther, Lynn Tao-Ning Wang, Nuo Xu and Tsu-Jae King Liu

Using Analytical pattern functions to evaluate stress distributions in a MOSFET structure, this method can be integrated in fast CAD tools.