Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences


UC Berkeley


2010 Research Summary

Delay Measurements of Nanotube Based Integrated Devices

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Jeffrey Bokor and Patrick Bennett1

Microelectronics Advanced Research Corporation

Using a CMOS based test chip, the transient delays of nanotube based transistors will be extracted. Nanotube devices will be fabricated and connected to a silicon test circuit which enables us to measure large quantities of devices in a novel manner. This allows for the observation of performance variability between similar devices and critical evaluation of the effect of fabrication process on performance. Furthermore, design constraints due to the test process have resulted in the development of novel methods of fabrication.

1Applied Science & Technology