Delay Measurements of Nanotube-based Integrated Devices
Jeffrey Bokor and Patrick Bennett1
Using a CMOS-based test chip, the transient delays of nanotube-based transistors will be extracted. Nanotube devices will be fabricated and connected to a silicon test circuit which enables us to measure large quantities of devices in a novel manner. This allows for the observation of performance variability between similar devices and critical evaluation of the effect of fabrication process on performance. Furthermore, design constraints due to the test process have resulted in the development of novel methods of fabrication.
1Applied Science & Technology