Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Characterization of Variability in Deeply-Scaled Fully Depleted SOI Devices

Aikaterini Papadopoulou

EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2012-11
January 13, 2012

http://www.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.pdf

Advisor: Borivoje Nikolic


BibTeX citation:

@mastersthesis{Papadopoulou:EECS-2012-11,
    Author = {Papadopoulou, Aikaterini},
    Title = {Characterization of Variability in Deeply-Scaled Fully Depleted SOI Devices},
    School = {EECS Department, University of California, Berkeley},
    Year = {2012},
    Month = {Jan},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.html},
    Number = {UCB/EECS-2012-11}
}

EndNote citation:

%0 Thesis
%A Papadopoulou, Aikaterini
%T Characterization of Variability in Deeply-Scaled Fully Depleted SOI Devices
%I EECS Department, University of California, Berkeley
%D 2012
%8 January 13
%@ UCB/EECS-2012-11
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.html
%F Papadopoulou:EECS-2012-11