Characterization of Variability in Deeply-Scaled Fully Depleted SOI Devices
Aikaterini Papadopoulou
EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2012-11
January 13, 2012
http://www.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.pdf
Advisor: Borivoje Nikolic
BibTeX citation:
@mastersthesis{Papadopoulou:EECS-2012-11,
Author = {Papadopoulou, Aikaterini},
Title = {Characterization of Variability in Deeply-Scaled Fully Depleted SOI Devices},
School = {EECS Department, University of California, Berkeley},
Year = {2012},
Month = {Jan},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.html},
Number = {UCB/EECS-2012-11}
}
EndNote citation:
%0 Thesis %A Papadopoulou, Aikaterini %T Characterization of Variability in Deeply-Scaled Fully Depleted SOI Devices %I EECS Department, University of California, Berkeley %D 2012 %8 January 13 %@ UCB/EECS-2012-11 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/2012/EECS-2012-11.html %F Papadopoulou:EECS-2012-11