Towards Automatically Checking Thousands of Failures with Micro-specifications
Haryadi S. Gunawi, Thanh Do, Pallavi Joshi, Joseph M. Hellerstein, Andrea C. Arpaci-Dusseau, Remzi H. Arpaci-Dusseau and Koushik Sen
EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2010-98
June 16, 2010
http://www.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-98.pdf
Recent data-loss incidents have shown that existing large distributed systems are still vulnerable to failures. To improve the situation, we propose two new testing approaches: failure testing service (FTS) and declarative testing specification (DTS). FTS enables us to systematically push a system into thousands of failure scenarios, leading us to many critical recovery bugs. With DTS, we introduce "micro-specifications", clear and concise specifications written in Datalog style, which enables developers to easily write, refine, and manage potentially hundreds of specifications.
BibTeX citation:
@techreport{Gunawi:EECS-2010-98,
Author = {Gunawi, Haryadi S. and Do, Thanh and Joshi, Pallavi and Hellerstein, Joseph M. and Arpaci-Dusseau, Andrea C. and Arpaci-Dusseau, Remzi H. and Sen, Koushik},
Title = {Towards Automatically Checking Thousands of Failures with Micro-specifications},
Institution = {EECS Department, University of California, Berkeley},
Year = {2010},
Month = {Jun},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-98.html},
Number = {UCB/EECS-2010-98},
Abstract = {Recent data-loss incidents have shown that existing
large distributed systems are still vulnerable to
failures. To improve the situation, we propose two
new testing approaches: failure testing service
(FTS) and declarative testing specification (DTS).
FTS enables us to systematically push a system into
thousands of failure scenarios, leading us to many
critical recovery bugs. With DTS, we introduce
"micro-specifications", clear and concise
specifications written in Datalog style, which
enables developers to easily write, refine, and
manage potentially hundreds of specifications.}
}
EndNote citation:
%0 Report %A Gunawi, Haryadi S. %A Do, Thanh %A Joshi, Pallavi %A Hellerstein, Joseph M. %A Arpaci-Dusseau, Andrea C. %A Arpaci-Dusseau, Remzi H. %A Sen, Koushik %T Towards Automatically Checking Thousands of Failures with Micro-specifications %I EECS Department, University of California, Berkeley %D 2010 %8 June 16 %@ UCB/EECS-2010-98 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/2010/EECS-2010-98.html %F Gunawi:EECS-2010-98