Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

MEMS-Based System for Particle Exposure Assessment Using Thin-Film Bulk Acoustic Wave Resonators and IR / UV Optical Discrimination

Justin Phelps Black

EECS Department
University of California, Berkeley
Technical Report No. UCB/EECS-2006-193
December 22, 2006

http://www.eecs.berkeley.edu/Pubs/TechRpts/2006/EECS-2006-193.pdf

Advisor: Richard M. White


BibTeX citation:

@phdthesis{Black:EECS-2006-193,
    Author = {Black, Justin Phelps},
    Title = {MEMS-Based System for Particle Exposure Assessment Using Thin-Film Bulk Acoustic Wave Resonators and IR / UV Optical Discrimination},
    School = {EECS Department, University of California, Berkeley},
    Year = {2006},
    Month = {Dec},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/2006/EECS-2006-193.html},
    Number = {UCB/EECS-2006-193}
}

EndNote citation:

%0 Thesis
%A Black, Justin Phelps
%T MEMS-Based System for Particle Exposure Assessment Using Thin-Film Bulk Acoustic Wave Resonators and IR / UV Optical Discrimination
%I EECS Department, University of California, Berkeley
%D 2006
%8 December 22
%@ UCB/EECS-2006-193
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/2006/EECS-2006-193.html
%F Black:EECS-2006-193