Technology Trend: Impact of Process Variations on Circuit Performance

T. Chien

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M03/37
September 2003

http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/ERL-03-37.pdf

BibTeX citation:

@techreport{Chien:M03/37,
    Author = {Chien, T.},
    Title = {Technology Trend: Impact of Process Variations on Circuit Performance},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {2003},
    Month = {Sep},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/4163.html},
    Number = {UCB/ERL M03/37}
}

EndNote citation:

%0 Report
%A Chien, T.
%T Technology Trend: Impact of Process Variations on Circuit Performance
%I EECS Department, University of California, Berkeley
%D 2003
%@ UCB/ERL M03/37
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/2003/4163.html
%F Chien:M03/37