A Framework for Robust Measurement-Based Admission Control
M. Grossglauser and David Tse
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M98/17
1998
BibTeX citation:
@techreport{Grossglauser:M98/17,
Author = {Grossglauser, M. and Tse, David},
Title = {A Framework for Robust Measurement-Based Admission Control},
Institution = {EECS Department, University of California, Berkeley},
Year = {1998},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1998/3406.html},
Number = {UCB/ERL M98/17}
}
EndNote citation:
%0 Report %A Grossglauser, M. %A Tse, David %T A Framework for Robust Measurement-Based Admission Control %I EECS Department, University of California, Berkeley %D 1998 %@ UCB/ERL M98/17 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/1998/3406.html %F Grossglauser:M98/17