M. Grossglauser and David Tse
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M98/17
April 1998
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/ERL-98-17.pdf
BibTeX citation:
@techreport{Grossglauser:M98/17, Author = {Grossglauser, M. and Tse, David}, Title = {A Framework for Robust Measurement-Based Admission Control}, Institution = {EECS Department, University of California, Berkeley}, Year = {1998}, Month = {Apr}, URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/3406.html}, Number = {UCB/ERL M98/17} }
EndNote citation:
%0 Report %A Grossglauser, M. %A Tse, David %T A Framework for Robust Measurement-Based Admission Control %I EECS Department, University of California, Berkeley %D 1998 %@ UCB/ERL M98/17 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1998/3406.html %F Grossglauser:M98/17