Study of Interconnect Variation on Circuit Performance

Z. Lin

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M97/80
October 1997

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/ERL-97-80.pdf

BibTeX citation:

@techreport{Lin:M97/80,
    Author = {Lin, Z.},
    Title = {Study of Interconnect Variation on Circuit Performance},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1997},
    Month = {Oct},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/3327.html},
    Number = {UCB/ERL M97/80}
}

EndNote citation:

%0 Report
%A Lin, Z.
%T Study of Interconnect Variation on Circuit Performance
%I EECS Department, University of California, Berkeley
%D 1997
%@ UCB/ERL M97/80
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1997/3327.html
%F Lin:M97/80