Electrical Testing of A CMOS Baseline Process

D. Rodriguez

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M94/63
August 1994

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1994/ERL-94-63.pdf

BibTeX citation:

@techreport{Rodriguez:M94/63,
    Author = {Rodriguez, D.},
    Title = {Electrical Testing of A CMOS Baseline Process},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1994},
    Month = {Aug},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1994/2608.html},
    Number = {UCB/ERL M94/63}
}

EndNote citation:

%0 Report
%A Rodriguez, D.
%T Electrical Testing of A CMOS Baseline Process
%I EECS Department, University of California, Berkeley
%D 1994
%@ UCB/ERL M94/63
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1994/2608.html
%F Rodriguez:M94/63