Electrical Testing of A CMOS Baseline Process
D. Rodriguez
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M94/63
1994
http://www.eecs.berkeley.edu/Pubs/TechRpts/1994/ERL-94-63.pdf
BibTeX citation:
@techreport{Rodriguez:M94/63,
Author = {Rodriguez, D.},
Title = {Electrical Testing of A CMOS Baseline Process},
Institution = {EECS Department, University of California, Berkeley},
Year = {1994},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1994/2608.html},
Number = {UCB/ERL M94/63}
}
EndNote citation:
%0 Report %A Rodriguez, D. %T Electrical Testing of A CMOS Baseline Process %I EECS Department, University of California, Berkeley %D 1994 %@ UCB/ERL M94/63 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/1994/2608.html %F Rodriguez:M94/63