Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Simulations of Limiting Current in a Crossed-Field Gap: Hull Diode

J. Verboncoeur and Charles K. (Ned) Birdsall

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M93/86
1993

Simulations confirm the Hull cutoff [1] as the limiting stable current for a space charge limited planar crossed-field diode. In addition, a current occurs beyond the Hull cutoff, with a near-zero average value plus a high frequency oscillatory component which dies rapidly in time. The diode reacts strongly to small increases in injection current above the current limit and magnetic field above the Hull cutoff, with a rapid reduction of transmitted current. The simulations are performed in ID3V, using PDP1 [2].


BibTeX citation:

@techreport{Verboncoeur:M93/86,
    Author = {Verboncoeur, J. and Birdsall, Charles K. (Ned)},
    Title = {Simulations of Limiting Current in a Crossed-Field Gap: Hull Diode},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1993},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1993/2460.html},
    Number = {UCB/ERL M93/86},
    Abstract = {Simulations confirm the Hull cutoff [1] as the limiting stable current for a space charge limited planar crossed-field diode. In addition, a current occurs beyond the Hull cutoff, with a near-zero average value plus a high frequency oscillatory component which dies rapidly in time. The diode reacts strongly to small increases in injection current above the current limit and magnetic field above the Hull cutoff, with a rapid reduction of transmitted current. The simulations are performed in ID3V, using PDP1 [2].}
}

EndNote citation:

%0 Report
%A Verboncoeur, J.
%A Birdsall, Charles K. (Ned)
%T Simulations of Limiting Current in a Crossed-Field Gap: Hull Diode
%I EECS Department, University of California, Berkeley
%D 1993
%@ UCB/ERL M93/86
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1993/2460.html
%F Verboncoeur:M93/86