Delay Fault Coverage, Test Set Size, and Performance Tradeoffs
W.K. Lam, A. Saldanha, Robert K. Brayton and Alberto L. Sangiovanni-Vincentelli
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M92/119
1992
BibTeX citation:
@techreport{Lam:M92/119,
Author = {Lam, W.K. and Saldanha, A. and Brayton, Robert K. and Sangiovanni-Vincentelli, Alberto L.},
Title = {Delay Fault Coverage, Test Set Size, and Performance Tradeoffs},
Institution = {EECS Department, University of California, Berkeley},
Year = {1992},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html},
Number = {UCB/ERL M92/119}
}
EndNote citation:
%0 Report %A Lam, W.K. %A Saldanha, A. %A Brayton, Robert K. %A Sangiovanni-Vincentelli, Alberto L. %T Delay Fault Coverage, Test Set Size, and Performance Tradeoffs %I EECS Department, University of California, Berkeley %D 1992 %@ UCB/ERL M92/119 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html %F Lam:M92/119