Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Delay Fault Coverage, Test Set Size, and Performance Tradeoffs

W.K. Lam, A. Saldanha, Robert K. Brayton and Alberto L. Sangiovanni-Vincentelli

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M92/119
1992


BibTeX citation:

@techreport{Lam:M92/119,
    Author = {Lam, W.K. and Saldanha, A. and Brayton, Robert K. and Sangiovanni-Vincentelli, Alberto L.},
    Title = {Delay Fault Coverage, Test Set Size, and Performance Tradeoffs},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1992},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html},
    Number = {UCB/ERL M92/119}
}

EndNote citation:

%0 Report
%A Lam, W.K.
%A Saldanha, A.
%A Brayton, Robert K.
%A Sangiovanni-Vincentelli, Alberto L.
%T Delay Fault Coverage, Test Set Size, and Performance Tradeoffs
%I EECS Department, University of California, Berkeley
%D 1992
%@ UCB/ERL M92/119
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1992/2195.html
%F Lam:M92/119