Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Combinational Test Generation Using Satisfiability

P.R. Stephan, Robert K. Brayton and Alberto L. Sangiovanni-Vincentelli

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M92/112
1992


BibTeX citation:

@techreport{Stephan:M92/112,
    Author = {Stephan, P.R. and Brayton, Robert K. and Sangiovanni-Vincentelli, Alberto L.},
    Title = {Combinational Test Generation Using Satisfiability},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1992},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1992/2183.html},
    Number = {UCB/ERL M92/112}
}

EndNote citation:

%0 Report
%A Stephan, P.R.
%A Brayton, Robert K.
%A Sangiovanni-Vincentelli, Alberto L.
%T Combinational Test Generation Using Satisfiability
%I EECS Department, University of California, Berkeley
%D 1992
%@ UCB/ERL M92/112
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1992/2183.html
%F Stephan:M92/112