Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

BERT - Berkeley Reliability Tools

R.H. Tu, E. Rosenbaum, C.C. Li, W.Y. Chan, P.M. Lee, B-K. Liew, J.D. Burnett, P.K. Ko and Chenming Hu

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M91/107
1991

http://www.eecs.berkeley.edu/Pubs/TechRpts/1991/ERL-91-107.pdf

Since its first release in May of 1989. the BErkeley Reliability Tools (BERT) has been steadily debugged, enhanced, and augmented. This is the second release of BERT and incorporates many new features not available in the first. BERT 2.0 is a circuit simulation program for reliability analysis, including the original modules: the Circuit Aging Simulator (CAS), Circuit Oxide Reliability Simulator (CORS), Electromigration (EM) - as well as a new module, the Bipolar Circuit Aging Simulator (BiCAS). Just like the first version of BERT, BERT 2.0 works with SPICE2 and SPICE3 circuit simulators (up to SPICE3ex). Furthermore, changes have been made so that the CORS module works with the IRSIM timing simulator. Other major enhancements include integration of BERT with the BSIM2 model, subcircuit expansion, and the addition of a second model for time dependent dielectric breakdown.


BibTeX citation:

@techreport{Tu:M91/107,
    Author = {Tu, R.H. and Rosenbaum, E. and Li, C.C. and Chan, W.Y. and Lee, P.M. and Liew, B-K. and Burnett, J.D. and Ko, P.K. and Hu, Chenming},
    Title = {BERT - Berkeley Reliability Tools},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1991},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1991/1887.html},
    Number = {UCB/ERL M91/107},
    Abstract = {Since its first release in May of 1989. the BErkeley Reliability
Tools (BERT) has been steadily debugged, enhanced, and 
augmented. This is the second release of BERT and incorporates
many new features not available in the first. BERT 2.0 is a circuit
simulation program for reliability analysis, including the original
modules: the Circuit Aging Simulator (CAS), Circuit Oxide Reliability
Simulator (CORS), Electromigration (EM) - as well as a new module,
the Bipolar Circuit Aging Simulator (BiCAS). Just like the first
version of BERT, BERT 2.0 works with SPICE2 and SPICE3 circuit
simulators (up to SPICE3ex). Furthermore, changes have been made
so that the CORS module works with the IRSIM timing simulator. Other
major enhancements include integration of BERT with the BSIM2
model, subcircuit expansion, and the addition of a second model for
time dependent dielectric breakdown.}
}

EndNote citation:

%0 Report
%A Tu, R.H.
%A Rosenbaum, E.
%A Li, C.C.
%A Chan, W.Y.
%A Lee, P.M.
%A Liew, B-K.
%A Burnett, J.D.
%A Ko, P.K.
%A Hu, Chenming
%T BERT - Berkeley Reliability Tools
%I EECS Department, University of California, Berkeley
%D 1991
%@ UCB/ERL M91/107
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1991/1887.html
%F Tu:M91/107