Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Techniques for Test Generation and Verification of VLSI Sequential Circuits

A. Ghosh

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M91/73
1991


BibTeX citation:

@techreport{Ghosh:M91/73,
    Author = {Ghosh, A.},
    Title = {Techniques for Test Generation and Verification of VLSI Sequential Circuits},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1991},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1991/1799.html},
    Number = {UCB/ERL M91/73}
}

EndNote citation:

%0 Report
%A Ghosh, A.
%T Techniques for Test Generation and Verification of VLSI Sequential Circuits
%I EECS Department, University of California, Berkeley
%D 1991
%@ UCB/ERL M91/73
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1991/1799.html
%F Ghosh:M91/73