Techniques for Test Generation and Verification of VLSI Sequential Circuits
A. Ghosh
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M91/73
1991
BibTeX citation:
@techreport{Ghosh:M91/73,
Author = {Ghosh, A.},
Title = {Techniques for Test Generation and Verification of VLSI Sequential Circuits},
Institution = {EECS Department, University of California, Berkeley},
Year = {1991},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1991/1799.html},
Number = {UCB/ERL M91/73}
}
EndNote citation:
%0 Report %A Ghosh, A. %T Techniques for Test Generation and Verification of VLSI Sequential Circuits %I EECS Department, University of California, Berkeley %D 1991 %@ UCB/ERL M91/73 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/1991/1799.html %F Ghosh:M91/73