BERT - Circuit Oxide Reliability Simulator (CORS)
E. Rosenbaum, P.M. Lee, R. Moazzami, P.K. Ko and Chenming Hu
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M90/4
1990
http://www.eecs.berkeley.edu/Pubs/TechRpts/1990/ERL-90-4.pdf
CORS (Circuit Oxide Reliability Simulator) is a fully integrated part of BERT (BErkeley Reliability Tools). CORS projects the probability of oxide breakdown induced circuit failure as a function of operating time, temperature, power supply voltage and input waveforms. CORS can also simulate the effects of burn-in on subsequent yield and lifetime. The user is required to provide the simulator with test capacitor breakdown statistics.
BibTeX citation:
@techreport{Rosenbaum:M90/4,
Author = {Rosenbaum, E. and Lee, P.M. and Moazzami, R. and Ko, P.K. and Hu, Chenming},
Title = {BERT - Circuit Oxide Reliability Simulator (CORS)},
Institution = {EECS Department, University of California, Berkeley},
Year = {1990},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1990/1386.html},
Number = {UCB/ERL M90/4},
Abstract = {CORS (Circuit Oxide Reliability Simulator) is a fully integrated part of BERT (BErkeley Reliability Tools). CORS projects the probability of oxide breakdown induced circuit failure as a function of operating time, temperature, power supply voltage and input waveforms. CORS can also simulate the effects of burn-in on subsequent yield and lifetime. The user is required to provide the simulator with test capacitor breakdown statistics.}
}
EndNote citation:
%0 Report %A Rosenbaum, E. %A Lee, P.M. %A Moazzami, R. %A Ko, P.K. %A Hu, Chenming %T BERT - Circuit Oxide Reliability Simulator (CORS) %I EECS Department, University of California, Berkeley %D 1990 %@ UCB/ERL M90/4 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/1990/1386.html %F Rosenbaum:M90/4