Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Extended Stuck-Fault Testability for Combinational Networks

R.C. McGeer, Robert K. Brayton, R.L. Rudell and Alberto L. Sangiovanni-Vincentelli

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M89/87
1989


BibTeX citation:

@techreport{McGeer:M89/87,
    Author = {McGeer, R.C. and Brayton, Robert K. and Rudell, R.L. and Sangiovanni-Vincentelli, Alberto L.},
    Title = {Extended Stuck-Fault Testability for Combinational Networks},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1989},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1989/1283.html},
    Number = {UCB/ERL M89/87}
}

EndNote citation:

%0 Report
%A McGeer, R.C.
%A Brayton, Robert K.
%A Rudell, R.L.
%A Sangiovanni-Vincentelli, Alberto L.
%T Extended Stuck-Fault Testability for Combinational Networks
%I EECS Department, University of California, Berkeley
%D 1989
%@ UCB/ERL M89/87
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1989/1283.html
%F McGeer:M89/87