Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Test Generation for Sequential Finite State Machines

H-K. T. Ma, S. Devadas, A. Richard Newton and Alberto L. Sangiovanni-Vincentelli

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M87/36
1987


BibTeX citation:

@techreport{Ma:M87/36,
    Author = {Ma, H-K. T. and Devadas, S. and Newton, A. Richard and Sangiovanni-Vincentelli, Alberto L.},
    Title = {Test Generation for Sequential Finite State Machines},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1987},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1987/887.html},
    Number = {UCB/ERL M87/36}
}

EndNote citation:

%0 Report
%A Ma, H-K. T.
%A Devadas, S.
%A Newton, A. Richard
%A Sangiovanni-Vincentelli, Alberto L.
%T Test Generation for Sequential Finite State Machines
%I EECS Department, University of California, Berkeley
%D 1987
%@ UCB/ERL M87/36
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1987/887.html
%F Ma:M87/36