A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System
N. Yuen
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M86/41
1986
BibTeX citation:
@techreport{Yuen:M86/41,
Author = {Yuen, N.},
Title = {A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System},
Institution = {EECS Department, University of California, Berkeley},
Year = {1986},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1986/694.html},
Number = {UCB/ERL M86/41}
}
EndNote citation:
%0 Report %A Yuen, N. %T A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System %I EECS Department, University of California, Berkeley %D 1986 %@ UCB/ERL M86/41 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/1986/694.html %F Yuen:M86/41