Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System

N. Yuen

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M86/41
1986


BibTeX citation:

@techreport{Yuen:M86/41,
    Author = {Yuen, N.},
    Title = {A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1986},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1986/694.html},
    Number = {UCB/ERL M86/41}
}

EndNote citation:

%0 Report
%A Yuen, N.
%T A Fully Automated BSIM Parameter Extraction System Using the HP 4062 Test System
%I EECS Department, University of California, Berkeley
%D 1986
%@ UCB/ERL M86/41
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1986/694.html
%F Yuen:M86/41