A System for Testing Custom Designed VLSI

J. Dinur

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M85/57
July 1985

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1985/ERL-85-57.pdf

BibTeX citation:

@techreport{Dinur:M85/57,
    Author = {Dinur, J.},
    Title = {A System for Testing Custom Designed VLSI},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1985},
    Month = {Jul},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1985/534.html},
    Number = {UCB/ERL M85/57}
}

EndNote citation:

%0 Report
%A Dinur, J.
%T A System for Testing Custom Designed VLSI
%I EECS Department, University of California, Berkeley
%D 1985
%@ UCB/ERL M85/57
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1985/534.html
%F Dinur:M85/57