Berkeley CMOS Process Test Patterns
William G. Oldham, Andrew R. Neureuther and Y. Shacham
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M84/26
1984
BibTeX citation:
@techreport{Oldham:M84/26,
Author = {Oldham, William G. and Neureuther, Andrew R. and Shacham, Y.},
Title = {Berkeley CMOS Process Test Patterns},
Institution = {EECS Department, University of California, Berkeley},
Year = {1984},
URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html},
Number = {UCB/ERL M84/26}
}
EndNote citation:
%0 Report %A Oldham, William G. %A Neureuther, Andrew R. %A Shacham, Y. %T Berkeley CMOS Process Test Patterns %I EECS Department, University of California, Berkeley %D 1984 %@ UCB/ERL M84/26 %U http://www.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html %F Oldham:M84/26