Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Berkeley CMOS Process Test Patterns

William G. Oldham, Andrew R. Neureuther and Y. Shacham

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M84/26
1984


BibTeX citation:

@techreport{Oldham:M84/26,
    Author = {Oldham, William G. and Neureuther, Andrew R. and Shacham, Y.},
    Title = {Berkeley CMOS Process Test Patterns},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1984},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html},
    Number = {UCB/ERL M84/26}
}

EndNote citation:

%0 Report
%A Oldham, William G.
%A Neureuther, Andrew R.
%A Shacham, Y.
%T Berkeley CMOS Process Test Patterns
%I EECS Department, University of California, Berkeley
%D 1984
%@ UCB/ERL M84/26
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html
%F Oldham:M84/26