Berkeley CMOS Process Test Patterns

William G. Oldham, Andrew R. Neureuther and Y. Shacham

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M84/26
1984


BibTeX citation:

@techreport{Oldham:M84/26,
    Author = {Oldham, William G. and Neureuther, Andrew R. and Shacham, Y.},
    Title = {Berkeley CMOS Process Test Patterns},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1984},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html},
    Number = {UCB/ERL M84/26}
}

EndNote citation:

%0 Report
%A Oldham, William G.
%A Neureuther, Andrew R.
%A Shacham, Y.
%T Berkeley CMOS Process Test Patterns
%I EECS Department, University of California, Berkeley
%D 1984
%@ UCB/ERL M84/26
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html
%F Oldham:M84/26