William G. Oldham, Andrew R. Neureuther and Y. Shacham
EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M84/26
March 1984
http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/ERL-m-84-26.pdf
BibTeX citation:
@techreport{Oldham:M84/26, Author = {Oldham, William G. and Neureuther, Andrew R. and Shacham, Y.}, Title = {Berkeley CMOS Process Test Patterns}, Institution = {EECS Department, University of California, Berkeley}, Year = {1984}, Month = {Mar}, URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html}, Number = {UCB/ERL M84/26} }
EndNote citation:
%0 Report %A Oldham, William G. %A Neureuther, Andrew R. %A Shacham, Y. %T Berkeley CMOS Process Test Patterns %I EECS Department, University of California, Berkeley %D 1984 %@ UCB/ERL M84/26 %U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/287.html %F Oldham:M84/26