A Fully Automated MOS Device Characterization System for Process- Oriented Integrated Circuit Design

B.S. Messenger

EECS Department
University of California, Berkeley
Technical Report No. UCB/ERL M84/18
January 1984

http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/ERL-m-84-18.pdf

BibTeX citation:

@techreport{Messenger:M84/18,
    Author = {Messenger, B.S.},
    Title = {A Fully Automated MOS Device Characterization System for Process- Oriented Integrated Circuit Design},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1984},
    Month = {Jan},
    URL = {http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/272.html},
    Number = {UCB/ERL M84/18}
}

EndNote citation:

%0 Report
%A Messenger, B.S.
%T A Fully Automated MOS Device Characterization System for Process- Oriented Integrated Circuit Design
%I EECS Department, University of California, Berkeley
%D 1984
%@ UCB/ERL M84/18
%U http://www2.eecs.berkeley.edu/Pubs/TechRpts/1984/272.html
%F Messenger:M84/18