Electrical Engineering
      and Computer Sciences

Electrical Engineering and Computer Sciences

COLLEGE OF ENGINEERING

UC Berkeley

Crystal: A Timing Analyzer for nMOS VLSI Circuits

John K. Ousterhout

EECS Department
University of California, Berkeley
Technical Report No. UCB/CSD-83-119
January 1983

http://www.eecs.berkeley.edu/Pubs/TechRpts/1983/CSD-83-119.pdf

Crystal is a timing analyzer for nMOS circuits designed in the Mead-Conway style. Based on the circuit extracted from a mask set, Crystal determines the length of each clock phase and pinpoints the longest paths. The analysis is independent of specific data values and uses critical path techniques along with a simple RC model of delays. Several additional techniques are used to improve the speed and accuracy of the program, including separate up/down timing, static level assignment, flow control for pass transistors, and precharging.


BibTeX citation:

@techreport{Ousterhout:CSD-83-119,
    Author = {Ousterhout, John K.},
    Title = {Crystal: A Timing Analyzer for nMOS VLSI Circuits},
    Institution = {EECS Department, University of California, Berkeley},
    Year = {1983},
    Month = {Jan},
    URL = {http://www.eecs.berkeley.edu/Pubs/TechRpts/1983/5571.html},
    Number = {UCB/CSD-83-119},
    Abstract = {Crystal is a timing analyzer for nMOS circuits designed in the Mead-Conway style. Based on the circuit extracted from a mask set, Crystal determines the length of each clock phase and pinpoints the longest paths. The analysis is independent of specific data values and uses critical path techniques along with a simple RC model of delays. Several additional techniques are used to improve the speed and accuracy of the program, including separate up/down timing, static level assignment, flow control for pass transistors, and precharging.}
}

EndNote citation:

%0 Report
%A Ousterhout, John K.
%T Crystal: A Timing Analyzer for nMOS VLSI Circuits
%I EECS Department, University of California, Berkeley
%D 1983
%@ UCB/CSD-83-119
%U http://www.eecs.berkeley.edu/Pubs/TechRpts/1983/5571.html
%F Ousterhout:CSD-83-119