Faculty Publications - Koushik Sen

Book chapters or sections

• M. K. Ramanathan, K. Sen, A. Grama, and S. Jagannathan, "Protocol inference using static path profiles," in Static Analysis: Proc. 1th Intl. Symp. (SAS 2008), M. Alpuente and G. Vidal, Eds., Lecture Notes in Computer Science, Vol. 5079, Berlin, Germany: Springer-Verlag, 2008, pp. 78-92.
• K. Chatterjee, K. Sen, and T. A. Henzinger, "Model-checking $omega$-regular properties of interval Markov chains," in Foundations of Software Science and Computational Structures (FoSSaCS 2008): Proc. 11th Intl. Conf., R. M. Amadio, Ed., Lecture Notes in Computer Science, Vol. 4962, Berlin, Germany: Springer-Verlag, 2008, pp. 302-317.
• K. Sen and M. Viswanathan, "Model checking multithreaded programs with asynchronous atomic methods," in Computer Aided Verification: Proc. 18th Intl. Conf. (CAV 2006), T. Ball and R. B. Jones, Eds., Lecture Notes in Computer Science, Vol. 4144, Berlin, Germany: Springer-Verlag, 2006, pp. 300-314.
• A. Vardhan, K. Sen, M. Viswanathan, and G. Agha, "Using language inference to verify omega-regular properties," in Tools and Algorithms for the Construction and Analysis of Systems: Proc. 11th Intl. Conf. (TACAS 2005), N. Halbwachs and L. Zuck, Eds., Lecture Notes in Computer Science, Vol. 3440, Berlin, Germany: Springer-Verlag, 2005, pp. 45-60.
• K. Sen, M. Viswanathan, and G. Agha, "Statistical model checking of black-box probabilistic systems," in Computer Aided Verification: Proc. 16th Intl. Conf. (CAV 2004), R. Alur and D. A. Peled, Eds., Lecture Notes in Computer Science, Vol. 3114, Berlin, Germany: Springer-Verlag, 2004, pp. 202-215.

Articles in journals or magazines

• J. Burnim, N. Jalbert, C. Stergiou, and K. Sen, "Looper: Lightweight Detection of Infinite Loops at Runtime," Automated Software Engineering, International Conference on, vol. 0, pp. 161-169, 2009.
• K. Asanović, R. Bodik, J. Demmel, T. Keaveny, K. Keutzer, N. Morgan, D. A. Patterson, K. Sen, J. Wawrzynek, D. Wessel, and K. A. Yelick, "A View of the Parallel Computing Landscape," Communications of the ACM, vol. 52, Oct. 2009.
• K. Sen, "Race directed random testing of concurrent programs," ACM SIGPLAN Notices, vol. 43, no. 6, pp. 11-21, June 2008.
• G. Rosu and K. Sen, "An instrumentation technique for online analysis of multithreaded programs," Concurrency and Computation: Practice and Experience, vol. 19, no. 3, pp. 311-325, March 2007.
• K. Sen, D. Marinov, and G. Agha, "CUTE: A concolic unit testing engine for C," ACM SIGSOFT Software Engineering Notes, vol. 30, no. 5, pp. 263-272, Sep. 2005.
• P. Godefroid, N. Klarlund, and K. Sen, "DART: Directed Automated Random Testing," ACM SIGPLAN Notices, vol. 40, no. 6, pp. 213-223, June 2005.
• K. Sen, G. Rosu, and G. Agha, "Runtime safety analysis of multithreaded programs," ACM SIGSOFT Software Engineering News, vol. 28, no. 5, pp. 337-346, Sep. 2003.

Articles in conference proceedings

• J. Burnim, S. Juvekar, and K. Sen, "WISE: Automated test generation for worst-case complexity," in ICSE '09: Proceedings of the 2009 IEEE 31st International Conference on Software Engineering, Washington, DC, USA: IEEE Computer Society, 2009, pp. 463--473.
• J. Burnim and K. Sen, "Asserting and checking determinism for multithreaded programs," in ESEC/FSE '09: Proceedings of the the 7th joint meeting of the European Software Engineering Conference and the ACM SIGSOFT symposium on the Foundations of Software Engineering, New York, NY, USA: ACM, 2009, pp. 3--12.
• C. S. Park and K. Sen, "Randomized active atomicity violation detection in concurrent programs," in Proc. 16th ACM SIGSOFT Intl. Symp. on the Foundations of Software Engineering (FSE 16), New York, NY: The Association for Computing Machinery, Inc., 2008.
• J. Burnim and K. Sen, "Heuristics for scalable dynamic test generation," in Proc. 23rd IEEE/ACM Intl. Conf. on Automated Software Engineering (ASE 2008), Piscataway, NJ: IEEE Press, 2008, pp. 443-446.
• P. Joshi and K. Sen, "Predictive typestate checking of multithreaded Java programs," in Proc. 23rd IEEE/ACM Intl. Conf. on Automated Software Engineering (ASE 2008), Piscataway, NJ: IEEE Press, 2008, pp. 288-296.
• Y. Kannan and K. Sen, "Universal symbolic execution and its application to likely data structure invariant generation," in Proc. 2008 Intl. Symp. on Software Testing and Analysis (ISSTA '08), New York, NY: The Association for Computing Machinery, Inc., 2008, pp. 283-294.
• K. Sen, "Race directed random testing of concurrent programs," in Proc. 2008 ACM SIGPLAN Conf. on Programming Language Design and Implementation (PLDI '08), New York, NY: The Association for Computing Machinery, Inc., 2008, pp. 11-21.
• K. Sen, "Effective random testing of concurrent programs," in Proc. 22nd IEEE/ACM Intl. Conf. on Automated Software Engineering (ASE 2007), New York, NY: The Association for Computing Machinery, Inc., 2007, pp. 323-332.
• K. Sen, "Concolic Testing (Invited Mini Tutorial)," in Proc. 22nd IEEE/ACM Intl. Conf. on Automated Software Engineering (ASE 2007), New York, NY: The Association for Computing Machinery, Inc., 2007, pp. 571-572.
• P. Joshi, K. Sen, and M. Shlimovich, "Predictive testing: Amplifying the effectiveness of software testing (Poster Session)," in 6th Joint Meeting of the European Software Engineering Conf./ACM SIGSOFT Symp. on Foundations of Software Engineering (ESEC/FSE 2007) Companion Papers, New York, NY: The Association for Computing Machinery, Inc., 2007, pp. 561-564.
• M. Emmi, R. Majumdar, and K. Sen, "Dynamic test input generation for database applications," in Proc. 2007 Intl. Symp. on Software Testing and Analysis (ISSTA '07), New York, NY: The Association for Computing Machinery, Inc., 2007, pp. 151-162.
• R. Majumdar and K. Sen, "Hybrid concolic testing," in Proc. 29th Intl. Conf. on Software Engineering (ICSE 2007), Los Alamitos, CA: IEEE Computer Society, 2007, pp. 416-426.
• K. Sen, D. Marinov, and G. Agha, "CUTE: A concolic unit testing engine for C (ACM SIGSOFT Distinguished Paper Award)," in Proc. Joint Meeting of the 10th European Software Engineering Conf./13th ACM SIGSOFT Intl. Symp. on Foundations of Sofware Engineering (ESEC/FSE 2005), H. C. Gall, Ed., New York, NY: The Association of Computing Machinery, Inc., 2005, pp. 263-272.
• K. Sen, A. Vardhan, G. Agha, and G. Rosu, "Efficient decentralized monitoring of safety in distributed systems," in Proc. 26th Intl. Conf. on Software Engineering (ICSE 2004), Los Alamitos, CA: IEEE Computer Society, 2004, pp. 418-427.
• K. Sen, G. Rosu, and G. Agha, "Runtime safety analysis of multithreaded programs," in Proc. Joint Meeting of the 9th European Software Engineering Conf./11th ACM SIGSOFT Intl. Symp. on Foundations of Software Engineeering (ESEC/FSE 2003), New York, NY: The Association for Computing Machinery, Inc., 2003, pp. 337-346.

Technical Reports

• R. Xia, T. Elmas, S. A. Kamil, A. Fox, and K. Sen, "Multi-level Debugging for Multi-stage, Parallelizing Compilers," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2012-227, Dec. 2012. [abstract]
• C. S. Park and K. Sen, "Concurrent Breakpoints," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2011-159, Dec. 2011. [abstract]
• J. Burnim, T. Elmas, G. Necula, and K. Sen, "NDetermin: Inferring Nondeterministic Sequential Specifications for Parallelism Correctness," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2011-143, Dec. 2011. [abstract]
• P. Joshi, H. S. Gunawi, and K. Sen, "PreFail: A Programmable Failure-Injection Framework," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2011-30, April 2011. [abstract]
• P. Joshi, H. S. Gunawi, and K. Sen, "PreFail: Programmable and Efficient Failure Testing Framework," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2011-3, Jan. 2011. [abstract]
• H. S. Gunawi, T. Do, P. Joshi, P. Alvaro, J. Yun, J. Oh, J. M. Hellerstein, A. C. Arpaci-Dusseau, R. H. Arpaci-Dusseau, K. Sen, and D. Borthakur, "FATE and DESTINI: A Framework for Cloud Recovery Testing," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2010-127, Sep. 2010. [abstract]
• H. S. Gunawi, T. Do, P. Joshi, J. M. Hellerstein, A. C. Arpaci-Dusseau, R. H. Arpaci-Dusseau, and K. Sen, "Towards Automatically Checking Thousands of Failures with Micro-specifications," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2010-98, June 2010. [abstract]
• H. Gunawi, T. Do, P. Joshi, J. M. Hellerstein, A. Arpaci-Dusseau, R. Arpaci-Dusseau, and K. Sen, "Towards Automatically Checking Thousands of Failures with Micro-specifications," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2010-97, June 2010. [abstract]
• J. Burnim, K. Sen, and C. Stergiou, "Testing Concurrent Programs on Relaxed Memory Models," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2010-32, March 2010.
• J. Burnim, K. Sen, and C. Stergiou, "Sound and Complete Monitoring of Sequential Consistency in Relaxed Memory Models," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2010-31, March 2010.
• S. Juvekar, J. Burnim, and K. Sen, "Path Slicing per Object for Better Testing, Debugging, and Usage Discovery," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2009-132, Sep. 2009. [abstract]
• J. Burnim and K. Sen, "Heuristics for Scalable Dynamic Test Generation," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2008-123, Sep. 2008. [abstract]
• K. Asanovic, R. Bodik, J. Demmel, T. Keaveny, K. Keutzer, J. D. Kubiatowicz, E. A. Lee, N. Morgan, G. Necula, D. A. Patterson, K. Sen, J. Wawrzynek, D. Wessel, and K. A. Yelick, "The Parallel Computing Laboratory at U.C. Berkeley: A Research Agenda Based on the Berkeley View," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2008-23, March 2008. [abstract]
• R. Majumdar and K. Sen, "LATEST : Lazy Dynamic Test Input Generation," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2007-36, March 2007. [abstract]
• P. Joshi, K. Sen, and M. Shlimovich, "Predictive Testing: Amplifying the Effectiveness of Software Testing," EECS Department, University of California, Berkeley, Tech. Rep. UCB/EECS-2007-35, March 2007. [abstract]

Patents

• P. I. Godefroid, N. Klarlund, and K. Sen, "Method and apparatus for performing unit testing of software modules with use of directed automated random testing," U.S. Patent Application. May 2005.